Matches in Library of Congress for { <http://lccn.loc.gov/94027227> ?p ?o. }
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- 94027227 contributor B7189387.
- 94027227 contributor B7189388.
- 94027227 created "c1995.".
- 94027227 date "1995".
- 94027227 date "c1995.".
- 94027227 dateCopyrighted "c1995.".
- 94027227 description "Includes bibliographical references (p. 89-94).".
- 94027227 extent "x, 95 p. :".
- 94027227 identifier "0818665327 (paper)".
- 94027227 issued "1995".
- 94027227 issued "c1995.".
- 94027227 language "eng".
- 94027227 publisher "Los Alamitos, Calif. : IEEE Computer Society Press,".
- 94027227 subject "621.3815/48/015192 20".
- 94027227 subject "Electronic circuits Testing.".
- 94027227 subject "Fault-tolerant computing.".
- 94027227 subject "Probabilities.".
- 94027227 subject "TK7867 .P56 1995".
- 94027227 title "A probabilistic analysis of test response compaction / Slawomir Pilarski and Tiko Kameda.".
- 94027227 type "text".