Matches in Library of Congress for { <http://lccn.loc.gov/94044624> ?p ?o. }
Showing items 1 to 22 of
22
with 100 items per page.
- 94044624 contributor B7209699.
- 94044624 contributor B7209700.
- 94044624 created "c1995.".
- 94044624 date "1995".
- 94044624 date "c1995.".
- 94044624 dateCopyrighted "c1995.".
- 94044624 description "Includes bibliographical references (p. 221-231) and index.".
- 94044624 extent "xv, 234 p. :".
- 94044624 identifier "0792395514 (acid-free paper)".
- 94044624 identifier 94044624-d.html.
- 94044624 identifier 94044624-t.html.
- 94044624 issued "1995".
- 94044624 issued "c1995.".
- 94044624 language "eng".
- 94044624 publisher "Boston : Kluwer Academic Publishers,".
- 94044624 subject "621.3815 20".
- 94044624 subject "Integrated circuits Defects.".
- 94044624 subject "Integrated circuits Design and construction Statistical methods.".
- 94044624 subject "Integrated circuits Reliability.".
- 94044624 subject "TK7874 .Z43 1995".
- 94044624 title "Yield and variability optimization of integrated circuits / J.C. Zhang, M.A. Styblinski.".
- 94044624 type "text".