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- 94045877 contributor B7211163.
- 94045877 created "c1995.".
- 94045877 date "1995".
- 94045877 date "c1995.".
- 94045877 dateCopyrighted "c1995.".
- 94045877 description "Includes bibliographical references and index.".
- 94045877 extent "xviii, 372 p. :".
- 94045877 identifier "0306448580".
- 94045877 identifier 94045877-d.html.
- 94045877 identifier 94045877-t.html.
- 94045877 issued "1995".
- 94045877 issued "c1995.".
- 94045877 language "eng".
- 94045877 publisher "New York : Plenum Press,".
- 94045877 subject "543/.08586 20".
- 94045877 subject "Electron beams Instruments.".
- 94045877 subject "Electron probe microanalysis.".
- 94045877 subject "QC793.5.E622 X14 1995".
- 94045877 subject "X-ray spectroscopy.".
- 94045877 title "X-ray spectrometry in electron beam instruments / edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury.".
- 94045877 type "text".