Matches in Library of Congress for { <http://lccn.loc.gov/94078172> ?p ?o. }
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- 94078172 alternative "TEST, the next 25 years.".
- 94078172 contributor B7228022.
- 94078172 contributor B7228023.
- 94078172 created "c1994.".
- 94078172 date "1994".
- 94078172 date "c1994.".
- 94078172 dateCopyrighted "c1994.".
- 94078172 description "Includes bibliographical references and index.".
- 94078172 extent "xii, 1033 p. :".
- 94078172 identifier "0780321022 (softbound)".
- 94078172 identifier "0780321030 (casebound)".
- 94078172 identifier "0780321049 (microfiche)".
- 94078172 issued "1994".
- 94078172 issued "c1994.".
- 94078172 language "eng".
- 94078172 publisher "Altoona, PA : The Conference ; Piscataway, N.J. : Can be ordered from IEEE Service Center,".
- 94078172 subject "621.3815/48 20".
- 94078172 subject "Electronic digital computers Circuits Testing Congresses.".
- 94078172 subject "Integrated circuits Testing Congresses.".
- 94078172 subject "TK7874 .I474 1994".
- 94078172 title "Proceedings / International Test Conference 1994.".
- 94078172 type "text".