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- 94233953 contributor B7368586.
- 94233953 contributor B7368587.
- 94233953 created "[1994], c1990.".
- 94233953 date "1994".
- 94233953 date "[1994], c1990.".
- 94233953 dateCopyrighted "[1994], c1990.".
- 94233953 description "Includes bibliographical references and index.".
- 94233953 extent "xviii, 652 p. :".
- 94233953 identifier "0780310624".
- 94233953 identifier 94233953.html.
- 94233953 identifier 94233953.html.
- 94233953 identifier 94233953.html.
- 94233953 issued "1994".
- 94233953 issued "[1994], c1990.".
- 94233953 language "eng".
- 94233953 publisher "New York : IEEE Press,".
- 94233953 subject "Digital integrated circuits Design and construction.".
- 94233953 subject "Digital integrated circuits Testing.".
- 94233953 subject "TK7874 .A23 1990b".
- 94233953 title "Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.".
- 94233953 type "text".