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- 95013386 contributor B7458674.
- 95013386 created "c1995.".
- 95013386 date "1995".
- 95013386 date "c1995.".
- 95013386 dateCopyrighted "c1995.".
- 95013386 description "Includes bibliographical references and index.".
- 95013386 extent "xiv, 213 p. :".
- 95013386 identifier "0750694726 (hardcover : alk. paper)".
- 95013386 identifier 95013386.html.
- 95013386 identifier 95013386.html.
- 95013386 issued "1995".
- 95013386 issued "c1995.".
- 95013386 language "eng".
- 95013386 publisher "Boston : Butterworth-Heinemann,".
- 95013386 subject "621.3815/48 20".
- 95013386 subject "Integrated circuits Testing.".
- 95013386 subject "Semiconductors Testing.".
- 95013386 subject "TK7874 .A339 1995".
- 95013386 title "Principles of semiconductor network testing / Amir Afshar.".
- 95013386 type "text".