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- 95033552 contributor B7478768.
- 95033552 created "1996.".
- 95033552 date "1996".
- 95033552 date "1996.".
- 95033552 dateCopyrighted "1996.".
- 95033552 description "Includes bibliographical references (p. 419-430) and indexes.".
- 95033552 extent "xix, 436 p. :".
- 95033552 identifier "0521482666".
- 95033552 identifier 95033552.html.
- 95033552 identifier 95033552.html.
- 95033552 issued "1996".
- 95033552 issued "1996.".
- 95033552 language "eng".
- 95033552 publisher "Cambridge ; New York : Cambridge University Press,".
- 95033552 subject "620/.44 20".
- 95033552 subject "Materials Microscopy.".
- 95033552 subject "Reflection electron microscopy.".
- 95033552 subject "Surfaces (Technology) Analysis.".
- 95033552 subject "TA417.23 .W36 1996".
- 95033552 title "Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang.".
- 95033552 type "text".