Matches in Library of Congress for { <http://lccn.loc.gov/95040166> ?p ?o. }
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- 95040166 contributor B7486508.
- 95040166 contributor B7486509.
- 95040166 created "c1995.".
- 95040166 date "1995".
- 95040166 date "c1995.".
- 95040166 dateCopyrighted "c1995.".
- 95040166 description "Includes bibliographical references (p. 197-205).".
- 95040166 extent "ix, 212 p. :".
- 95040166 identifier "0792396588 (hardcover : alk. paper)".
- 95040166 identifier 95040166-d.html.
- 95040166 identifier 95040166-t.html.
- 95040166 isPartOf "Frontiers in electronic testing".
- 95040166 issued "1995".
- 95040166 issued "c1995.".
- 95040166 language "eng".
- 95040166 publisher "Dordrecht ; Boston : Kluwer Academic Publishers,".
- 95040166 subject "621.3815/48 20".
- 95040166 subject "Automatic test equipment.".
- 95040166 subject "Digital integrated circuits Testing.".
- 95040166 subject "TK7874.65 .B44 1995".
- 95040166 title "Testability concepts for digital ICs : the macro test approach / by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.".
- 95040166 type "text".