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- 95060438 contributor B7502415.
- 95060438 contributor B7502416.
- 95060438 contributor B7502417.
- 95060438 created "c1995.".
- 95060438 date "1995".
- 95060438 date "c1995.".
- 95060438 dateCopyrighted "c1995.".
- 95060438 description "Includes bibliographical references and indexes.".
- 95060438 extent "viii, 245 p. :".
- 95060438 identifier "1566770971 (pbk.)".
- 95060438 isPartOf "Proceedings (Electrochemical Society) ; v. 95-3.".
- 95060438 isPartOf "Proceedings / Electrochemical Society ; v. 95-3".
- 95060438 issued "1995".
- 95060438 issued "c1995.".
- 95060438 language "eng".
- 95060438 publisher "Pennington, NJ : Electrochemical Society,".
- 95060438 subject "Breakdown (Electricity) Congresses.".
- 95060438 subject "Electrodiffusion Congresses.".
- 95060438 subject "Metallic films Electric properties Congresses.".
- 95060438 subject "TK7872.T55 S93 1995".
- 95060438 subject "Thin film devices Reliability Congresses.".
- 95060438 title "Proceedings of the Symposium on Reliability of Metals in Electronics / edited by Hazara S. Rathore.".
- 95060438 type "text".