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- 95070378 contributor B7506769.
- 95070378 contributor B7506770.
- 95070378 created "c1995.".
- 95070378 date "1995".
- 95070378 date "c1995.".
- 95070378 dateCopyrighted "c1995.".
- 95070378 description "Includes bibliographic references and index.".
- 95070378 extent "vii, 284 p. :".
- 95070378 identifier "0819420018".
- 95070378 isPartOf "Proceedings / SPIE--the International Society for Optical Engineering ; v. 2635".
- 95070378 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 2635.".
- 95070378 issued "1995".
- 95070378 issued "c1995.".
- 95070378 language "eng".
- 95070378 publisher "Bellingham, Wash., USA : SPIE,".
- 95070378 subject "621.381 21".
- 95070378 subject "Integrated circuits Very large scale integration Congresses.".
- 95070378 subject "Microelectronics Congresses.".
- 95070378 subject "TK7874 .M4688 1995".
- 95070378 title "Microelectronic manufacturing yield, reliability, and failure analysis : 25-26 October 1995, Austin, Texas / Gopal Rao, Massimo Piccoli, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 95070378 type "text".