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- 95077004 contributor B7510967.
- 95077004 contributor B7510968.
- 95077004 created "[1996]".
- 95077004 date "1996".
- 95077004 date "[1996]".
- 95077004 dateCopyrighted "[1996]".
- 95077004 description "Includes bibliographical references.".
- 95077004 extent "v, 24, 173 p. :".
- 95077004 identifier "0780327055".
- 95077004 issued "1996".
- 95077004 issued "[1996]".
- 95077004 language "eng".
- 95077004 publisher "[New York] : IEEE Electron Devices Society : IEEE Reliability Society,".
- 95077004 subject "621.3815 20".
- 95077004 subject "Integrated circuits Reliability Congresses.".
- 95077004 subject "Integrated circuits Wafer scale integration Reliability Congresses.".
- 95077004 subject "TK7874 .I583 1995".
- 95077004 title "1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.".
- 95077004 type "text".