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- 95078165 alternative "5th International Symposium on the Physical & Failure Analysis of Integrated Circuits".
- 95078165 contributor B7511969.
- 95078165 contributor B7511970.
- 95078165 contributor B7511971.
- 95078165 created "1995.".
- 95078165 date "1995".
- 95078165 date "1995.".
- 95078165 dateCopyrighted "1995.".
- 95078165 description "Includes bibliographical references and index.".
- 95078165 extent "230 p. :".
- 95078165 identifier "0780327977 (pbk.)".
- 95078165 identifier "0780327985 (microfiche ed.)".
- 95078165 issued "1995".
- 95078165 issued "1995.".
- 95078165 language "eng".
- 95078165 publisher "Piscataway, NJ : Institute of Electrical and Electronics Engineers,".
- 95078165 subject "621.3815 20".
- 95078165 subject "Integrated circuits Defects Congresses.".
- 95078165 subject "Integrated circuits Testing Congresses.".
- 95078165 subject "TK7874 .I47377 1995".
- 95078165 title "5th International Symposium on the Physical & Failure Analysis of Integrated Circuits".
- 95078165 title "Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits / edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore.".
- 95078165 type "text".