Matches in Library of Congress for { <http://lccn.loc.gov/96005441> ?p ?o. }
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- 96005441 contributor B7742011.
- 96005441 contributor B7742012.
- 96005441 created "c1996.".
- 96005441 date "1996".
- 96005441 date "c1996.".
- 96005441 dateCopyrighted "c1996.".
- 96005441 description "Includes bibliographical references and index.".
- 96005441 extent "150 p. :".
- 96005441 identifier "0792397142 (acid-free paper)".
- 96005441 identifier 96005441-d.html.
- 96005441 identifier 96005441-t.html.
- 96005441 isPartOf "Frontiers in electronic testing".
- 96005441 issued "1996".
- 96005441 issued "c1996.".
- 96005441 language "eng".
- 96005441 publisher "Boston : Kluwer Academic Publishers,".
- 96005441 subject "621.3815/2/0685 20".
- 96005441 subject "Computer-aided design.".
- 96005441 subject "Integrated circuits Very large scale integration Computer simulation.".
- 96005441 subject "Integrated circuits Very large scale integration Defects.".
- 96005441 subject "Integrated circuits Very large scale integration Testing.".
- 96005441 subject "TK7874.75 .K47 1996".
- 96005441 title "From contamination to defects, faults, and yield loss : simulation and applications / by Jitendra B. Khare, Wojciech Maly.".
- 96005441 type "text".