Matches in Library of Congress for { <http://lccn.loc.gov/96042114> ?p ?o. }
Showing items 1 to 21 of
21
with 100 items per page.
- 96042114 contributor B7784484.
- 96042114 created "c1997.".
- 96042114 date "1997".
- 96042114 date "c1997.".
- 96042114 dateCopyrighted "c1997.".
- 96042114 description "Includes bibliographical references and index.".
- 96042114 extent "xii, 199 p. :".
- 96042114 identifier "0124343309 (alk. paper)".
- 96042114 identifier 96042114.html.
- 96042114 identifier 96042114.html.
- 96042114 issued "1997".
- 96042114 issued "c1997.".
- 96042114 language "eng".
- 96042114 publisher "San Diego : Academic Press,".
- 96042114 subject "621.39/5/0287 20".
- 96042114 subject "Digital integrated circuits Testing.".
- 96042114 subject "Integrated circuits Fault tolerance.".
- 96042114 subject "Integrated circuits Very large scale integration Testing.".
- 96042114 subject "TK7874.75 .L35 1997".
- 96042114 title "Digital circuit testing and testability / Parag K. Lala.".
- 96042114 type "text".