Matches in Library of Congress for { <http://lccn.loc.gov/96069469> ?p ?o. }
Showing items 1 to 21 of
21
with 100 items per page.
- 96069469 contributor B7801687.
- 96069469 contributor B7801688.
- 96069469 created "c1996.".
- 96069469 date "1996".
- 96069469 date "c1996.".
- 96069469 dateCopyrighted "c1996.".
- 96069469 description "Includes bibliographic references and author index.".
- 96069469 extent "ix, 372 p. :".
- 96069469 identifier "081942272X".
- 96069469 isPartOf "Proceedings / SPIE--the International Society for Optical Engineering ; v. 2874".
- 96069469 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 2874.".
- 96069469 issued "1996".
- 96069469 issued "c1996.".
- 96069469 language "eng".
- 96069469 publisher "Bellingham, Wash., USA : SPIE,".
- 96069469 subject "621.381 21".
- 96069469 subject "Integrated circuits Very large scale integration Congresses.".
- 96069469 subject "Microelectronics Congresses.".
- 96069469 subject "TK7874 .M458 1996".
- 96069469 title "Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October, 1996, Austin, Texas / Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ... [et al.]".
- 96069469 type "text".