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- 96077320 alternative "1996 IEEE International Workshop on IDDQ Testing".
- 96077320 alternative "IDDQ 96".
- 96077320 alternative "IEEE International Workshop on IDDQ Testing".
- 96077320 contributor B7806363.
- 96077320 contributor B7806364.
- 96077320 contributor B7806365.
- 96077320 created "c1996.".
- 96077320 date "1996".
- 96077320 date "c1996.".
- 96077320 dateCopyrighted "c1996.".
- 96077320 description "Includes bibliographical references.".
- 96077320 extent "ix, 105 p. :".
- 96077320 identifier "0818676558".
- 96077320 identifier "0818676574 (microfiche)".
- 96077320 issued "1996".
- 96077320 issued "c1996.".
- 96077320 language "eng".
- 96077320 publisher "Los Alamitos, Calif. : IEEE Computer Society Press,".
- 96077320 subject "621.39/732 21".
- 96077320 subject "Iddq testing Congresses.".
- 96077320 subject "Metal oxide semiconductors, Complementary Testing Congresses.".
- 96077320 subject "TK7871.99.M44 I34 1996".
- 96077320 title "1996 IEEE International Workshop on IDDQ Testing".
- 96077320 title "Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C. / edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.".
- 96077320 title "IDDQ 96".
- 96077320 title "IEEE International Workshop on IDDQ Testing".
- 96077320 type "text".