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- 96077509 contributor B7806545.
- 96077509 contributor B7806546.
- 96077509 created "c1996.".
- 96077509 date "1996".
- 96077509 date "c1996.".
- 96077509 dateCopyrighted "c1996.".
- 96077509 description "Includes bibliographic references.".
- 96077509 extent "vi, 175 p. :".
- 96077509 identifier "0780335988 (softbound)".
- 96077509 identifier "0780335996 (microfiche)".
- 96077509 issued "1996".
- 96077509 issued "c1996.".
- 96077509 language "eng".
- 96077509 publisher "[New York] : IEEE Electron Devices Society : IEEE Reliability Society,".
- 96077509 subject "621.3815 21".
- 96077509 subject "Integrated circuits Reliability Congresses.".
- 96077509 subject "Integrated circuits Wafer scale integration Reliability Congresses.".
- 96077509 subject "TK7874 .I4735 1996".
- 96077509 title "1996 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.".
- 96077509 type "text".