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- 96079035 contributor B7807876.
- 96079035 contributor B7807877.
- 96079035 created "c1997.".
- 96079035 date "1997".
- 96079035 date "c1997.".
- 96079035 dateCopyrighted "c1997.".
- 96079035 description "Includes bibliographical references.".
- 96079035 extent "vi, 124 p. :".
- 96079035 identifier "0780337379 (softbound)".
- 96079035 identifier "0780337387 (microfiche)".
- 96079035 issued "1997".
- 96079035 issued "c1997.".
- 96079035 language "eng".
- 96079035 publisher "[New York] : Institute of Electrical and Electronics Engineers,".
- 96079035 subject "Semiconductors Characterization Statistical methods Congresses.".
- 96079035 subject "Semiconductors Measurement Congresses.".
- 96079035 subject "TK7871.85 .I5844 1997".
- 96079035 title "1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto / sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics ... [et al.].".
- 96079035 type "text".