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- 96086110 contributor B7811694.
- 96086110 created "1996.".
- 96086110 date "1996".
- 96086110 date "1996.".
- 96086110 dateCopyrighted "1996.".
- 96086110 description "Includes bibliographical references and index.".
- 96086110 extent "xxii, 444 p. :".
- 96086110 identifier "096526694X (pbk.)".
- 96086110 issued "1996".
- 96086110 issued "1996.".
- 96086110 language "eng".
- 96086110 publisher "College Park, Md. : Center for Reliability Engineering, University of Maryland,".
- 96086110 subject "621.3815 21".
- 96086110 subject "Integrated circuits Reliability.".
- 96086110 subject "Microwave integrated circuits Reliability.".
- 96086110 subject "Semiconductors Thermal properties.".
- 96086110 subject "TK7874 .C54483 1996".
- 96086110 subject "Transistors Reliability.".
- 96086110 title "Reliability of high temperature electronics / Aris Chistou.".
- 96086110 type "text".