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- 96129383 contributor B7845983.
- 96129383 contributor B7845984.
- 96129383 created "1995.".
- 96129383 date "1995".
- 96129383 date "1995.".
- 96129383 dateCopyrighted "1995.".
- 96129383 description "Includes bibliographical references.".
- 96129383 extent "iv, 1v. (various pagings) ;".
- 96129383 isPartOf "NIST Special Publication ; 400-98".
- 96129383 isPartOf "Semiconductor measurement technology".
- 96129383 issued "1995".
- 96129383 issued "1995.".
- 96129383 language "eng".
- 96129383 publisher "Gaithersburg, MD : U.S. Department of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O.,".
- 96129383 subject "621.3815/2 21".
- 96129383 subject "Compound semiconductors.".
- 96129383 subject "Optical measurements.".
- 96129383 subject "QA100 .U57 no. 400-98 TK7871.85".
- 96129383 subject "Semiconductors Characterization.".
- 96129383 title "Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry / W. Murrary Bullis, S. Perkowitz, D.G. Seoler.".
- 96129383 type "text".