Matches in Library of Congress for { <http://lccn.loc.gov/96154690> ?p ?o. }
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- 96154690 contributor B7873967.
- 96154690 created "1995.".
- 96154690 date "1995".
- 96154690 date "1995.".
- 96154690 dateCopyrighted "1995.".
- 96154690 description "Includes bibliographical references.".
- 96154690 extent "iv, 171 p. :".
- 96154690 identifier "3891919832".
- 96154690 isPartOf "Series in microelectronics, 0936-5362 ; v. 51".
- 96154690 issued "1995".
- 96154690 issued "1995.".
- 96154690 language "eng ger".
- 96154690 language "eng".
- 96154690 publisher "Konstanz : Hartung-Gorre,".
- 96154690 subject "621.3815 21".
- 96154690 subject "Electric discharges.".
- 96154690 subject "Electrostatics.".
- 96154690 subject "Integrated circuits Very large scale integration Reliability.".
- 96154690 subject "Metal oxide semiconductors Reliability.".
- 96154690 subject "TK7874.75 .R45 1995".
- 96154690 title "Latent gate oxide damage induced by ultra-fast electrostatic discharge / Joachim C. Reiner.".
- 96154690 type "text".