Matches in Library of Congress for { <http://lccn.loc.gov/97011255> ?p ?o. }
Showing items 1 to 24 of
24
with 100 items per page.
- 97011255 alternative "Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen. English".
- 97011255 contributor B8036666.
- 97011255 created "c1998.".
- 97011255 date "1998".
- 97011255 date "c1998.".
- 97011255 dateCopyrighted "c1998.".
- 97011255 description "Includes bibliographical references and index.".
- 97011255 extent "xiv, 173 p. :".
- 97011255 identifier "0471974013".
- 97011255 identifier 97011255.html.
- 97011255 identifier 97011255.html.
- 97011255 isPartOf "Wiley series in quality and reliability engineering".
- 97011255 issued "1998".
- 97011255 issued "c1998.".
- 97011255 language "eng ger".
- 97011255 language "eng".
- 97011255 publisher "Chichester ; New York : Wiley,".
- 97011255 subject "621.3815 21".
- 97011255 subject "Semiconductors Failures.".
- 97011255 subject "Semiconductors Testing.".
- 97011255 subject "TK7871.852 .B43 1997".
- 97011255 title "Integrated circuit failure analysis : a guide to preparation techniques / Friedrich Beck ; translated by Stephen S. Wilson.".
- 97011255 title "Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen. English".
- 97011255 type "text".