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- 97016861 contributor B8043170.
- 97016861 contributor B8043171.
- 97016861 created "c1997.".
- 97016861 date "1997".
- 97016861 date "c1997.".
- 97016861 dateCopyrighted "c1997.".
- 97016861 description "Includes bibliographical references (p. 287-315) and index.".
- 97016861 extent "xvii, 322 p. :".
- 97016861 identifier "0792399455 (acid-free paper)".
- 97016861 identifier 97016861-d.html.
- 97016861 identifier 97016861-t.html.
- 97016861 isPartOf "Frontiers in electronic testing".
- 97016861 issued "1997".
- 97016861 issued "c1997.".
- 97016861 language "eng".
- 97016861 publisher "Boston : Kluwer Academic Publishers,".
- 97016861 subject "621.39/5/0287 21".
- 97016861 subject "Digital integrated circuits Testing.".
- 97016861 subject "Iddq testing.".
- 97016861 subject "Integrated circuits Very large scale integration Testing.".
- 97016861 subject "TK7871.99.M44 C4 1997".
- 97016861 title "Introduction to ID̳D̳Q̳ testing / by Sreejit Chakravarty and Paul J. Thadikaran.".
- 97016861 type "text".