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- 97039048 contributor B8069223.
- 97039048 created "c1998.".
- 97039048 date "1998".
- 97039048 date "c1998.".
- 97039048 dateCopyrighted "c1998.".
- 97039048 description "Includes bibliographical references and index.".
- 97039048 extent "xiv, 308 p. :".
- 97039048 identifier "0792380835 (hardbound : alk. paper)".
- 97039048 isPartOf "Frontiers in electronic testing".
- 97039048 issued "1998".
- 97039048 issued "c1998.".
- 97039048 language "eng".
- 97039048 publisher "Boston : Kluwer Academic,".
- 97039048 subject "621.3815 21".
- 97039048 subject "Digital integrated circuits Testing.".
- 97039048 subject "Linear integrated circuits Testing.".
- 97039048 subject "Metal oxide semiconductors, Complementary Defects.".
- 97039048 subject "Metal oxide semiconductors, Complementary Testing.".
- 97039048 subject "TK7871.99.M44 S23 1998".
- 97039048 title "Defect oriented testing for CMOS analog and digital circuits / by Manoj Sachdev.".
- 97039048 type "text".