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- 97039195 contributor B8069394.
- 97039195 contributor B8069395.
- 97039195 created "c1998.".
- 97039195 date "1998".
- 97039195 date "c1998.".
- 97039195 dateCopyrighted "c1998.".
- 97039195 description "Includes bibliographical references (p. [333]-361) and index.".
- 97039195 extent "xxvi, 394 p. :".
- 97039195 identifier "0792381076 (alk. paper)".
- 97039195 identifier 97039195-d.html.
- 97039195 identifier 97039195-t.html.
- 97039195 issued "1998".
- 97039195 issued "c1998.".
- 97039195 language "eng".
- 97039195 publisher "Boston, Mass : Kluwer Academic Publishers,".
- 97039195 subject "621.381 21".
- 97039195 subject "Computer software Development Reliability.".
- 97039195 subject "Integrated circuits Design and construction Reliability.".
- 97039195 subject "Microelectronics Reliability.".
- 97039195 subject "Semiconductors Computer programs Reliability.".
- 97039195 subject "TK7874 .K867 1998".
- 97039195 title "Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim.".
- 97039195 type "text".