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- 97052094 contributor B8082994.
- 97052094 created "c1998.".
- 97052094 date "1998".
- 97052094 date "c1998.".
- 97052094 dateCopyrighted "c1998.".
- 97052094 description "Includes bibliographical references and index.".
- 97052094 extent "xxiv, 760 p. :".
- 97052094 identifier "0471241393 (cloth : alk. paper)".
- 97052094 identifier 97052094.html.
- 97052094 identifier 97052094.html.
- 97052094 identifier 97052094.html.
- 97052094 issued "1998".
- 97052094 issued "c1998.".
- 97052094 language "eng".
- 97052094 publisher "New York : Wiley,".
- 97052094 subject "621.3815/2 21".
- 97052094 subject "QC611 .S335 1998".
- 97052094 subject "Semiconductors Testing.".
- 97052094 subject "Semiconductors.".
- 97052094 title "Semiconductor material and device characterization / Dieter K. Schroder.".
- 97052094 type "text".