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- 97080028 contributor B8096442.
- 97080028 contributor B8096443.
- 97080028 created "c1997.".
- 97080028 date "1997".
- 97080028 date "c1997.".
- 97080028 dateCopyrighted "c1997.".
- 97080028 description "Includes bibliographical references.".
- 97080028 extent "v, 161 p. :".
- 97080028 identifier "0780342054 (softbound)".
- 97080028 identifier "0780342062 (microfiche)".
- 97080028 issued "1997".
- 97080028 issued "c1997.".
- 97080028 language "eng".
- 97080028 publisher "Piscataway, New Jersey : IEEE Electron Devices Society : IEEE Reliability Society,".
- 97080028 subject "621.3815 21".
- 97080028 subject "Integrated circuits Reliability Congresses.".
- 97080028 subject "Integrated circuits Wafer-scale integration Reliability Congresses.".
- 97080028 subject "TK7874 .I5944 1997".
- 97080028 title "1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society".
- 97080028 type "text".