Matches in Library of Congress for { <http://lccn.loc.gov/97176703> ?p ?o. }
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- 97176703 contributor B8184707.
- 97176703 created "[1997]".
- 97176703 date "1997".
- 97176703 date "[1997]".
- 97176703 dateCopyrighted "[1997]".
- 97176703 description "Includes bibliographical references (p. 33-36).".
- 97176703 extent "iii, 57 p. :".
- 97176703 isPartOf "NIST technical note ; 1390".
- 97176703 issued "1997".
- 97176703 issued "[1997]".
- 97176703 language "eng".
- 97176703 publisher "Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O.,".
- 97176703 subject "602/.18 s 621.3815/2 21".
- 97176703 subject "Current noise (Electricity)".
- 97176703 subject "Electronic noise Measurement.".
- 97176703 subject "Impedance matching.".
- 97176703 subject "QC100 .U5753 no. 1390 TK7871.85".
- 97176703 subject "Semiconductor wafers Testing.".
- 97176703 title "Noise temperature measurements on wafer / J. Randa.".
- 97176703 type "text".