Matches in Library of Congress for { <http://lccn.loc.gov/98002765> ?p ?o. }
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- 98002765 contributor B8319559.
- 98002765 created "c1998.".
- 98002765 date "1998".
- 98002765 date "c1998.".
- 98002765 dateCopyrighted "c1998.".
- 98002765 description "Includes bibliographical references (p. 447-461) and index.".
- 98002765 extent "xix, 475 p. :".
- 98002765 identifier "0824701828 (alk. paper)".
- 98002765 identifier 98002765-d.html.
- 98002765 issued "1998".
- 98002765 issued "c1998.".
- 98002765 language "eng".
- 98002765 publisher "New York : Marcel Dekker,".
- 98002765 subject "621.3815 21".
- 98002765 subject "Digital integrated circuits Testing.".
- 98002765 subject "TK7874 .D365 1998".
- 98002765 title "Random testing of digital circuits : theory and applications / René David.".
- 98002765 type "text".