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- 98026178 contributor B8347020.
- 98026178 created "c1998.".
- 98026178 date "1998".
- 98026178 date "c1998.".
- 98026178 dateCopyrighted "c1998.".
- 98026178 description "Includes bibliographical references and index.".
- 98026178 extent "xiv, 527 p. :".
- 98026178 identifier "3540639764 (hardcover ; alk. paper)".
- 98026178 identifier 98026178-d.html.
- 98026178 isPartOf "Springer series in optical sciences ; v. 45".
- 98026178 issued "1998".
- 98026178 issued "c1998.".
- 98026178 language "eng".
- 98026178 publisher "Berlin ; New York : Springer,".
- 98026178 subject "502/.8/25 21".
- 98026178 subject "QH212.S3 R452 1998".
- 98026178 subject "Scanning electron microscopy.".
- 98026178 title "Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.".
- 98026178 type "text".