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- 98047149 contributor B8370842.
- 98047149 contributor B8370843.
- 98047149 created "c1999.".
- 98047149 date "1999".
- 98047149 date "c1999.".
- 98047149 dateCopyrighted "c1999.".
- 98047149 description "Includes bibliographical references and index.".
- 98047149 extent "xi, 256 p. :".
- 98047149 identifier "354062029X (hardcover : alk. paper)".
- 98047149 isPartOf "Springer tracts in modern physics ; 149.".
- 98047149 isPartOf "Springer tracts in modern physics, 0081-3869 ; v. 149".
- 98047149 issued "1999".
- 98047149 issued "c1999.".
- 98047149 language "eng".
- 98047149 publisher "Berlin ; New York : Springer,".
- 98047149 subject "539 s 530.4/175 21".
- 98047149 subject "QC1 .S797 vol. 149 QC176.84.O7".
- 98047149 subject "Thin films Optical properties.".
- 98047149 subject "Thin films, Multilayered Optical properties.".
- 98047149 subject "X-rays Diffraction.".
- 98047149 subject "X-rays Scattering.".
- 98047149 title "High-resolution X-ray scattering from thin films and multilayers / Václav Holý, Ullrich Pietsch, Tilo Baumbach.".
- 98047149 type "text".