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- 98051769 contributor B8376035.
- 98051769 created "c1999.".
- 98051769 date "1999".
- 98051769 date "c1999.".
- 98051769 dateCopyrighted "c1999.".
- 98051769 description "Includes bibliographical references and index.".
- 98051769 extent "ix, 255 p. :".
- 98051769 identifier "0412145618 (acid-free paper)".
- 98051769 identifier 98051769-d.html.
- 98051769 identifier 98051769-t.html.
- 98051769 issued "1999".
- 98051769 issued "c1999.".
- 98051769 language "eng".
- 98051769 publisher "Boston, Mass. : Kluwer Academic Publishers,".
- 98051769 subject "621.3815 21".
- 98051769 subject "Integrated circuits Reliability.".
- 98051769 subject "Integrated circuits Testing.".
- 98051769 subject "Semiconductors Failures.".
- 98051769 subject "TK7871.852 .F35 1999".
- 98051769 title "Failure analysis of integrated circuits : tools and techniques / edited by Lawrence C. Wagner.".
- 98051769 type "text".