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- 98158684 alternative "Diagnostic techniques for semiconductor materials and devices".
- 98158684 contributor B8462045.
- 98158684 contributor B8462046.
- 98158684 contributor B8462047.
- 98158684 created "c1997.".
- 98158684 date "1997".
- 98158684 date "c1997.".
- 98158684 dateCopyrighted "c1997.".
- 98158684 description "Includes bibliographical references and indexes.".
- 98158684 extent "ix, 478 p. :".
- 98158684 identifier "1566771390".
- 98158684 isPartOf "ECS proceedings ; v. 97-12".
- 98158684 isPartOf "Proceedings (Electrochemical Society) ; v. 97-12.".
- 98158684 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3322.".
- 98158684 isPartOf "SPIE ; v. 3322".
- 98158684 issued "1997".
- 98158684 issued "c1997.".
- 98158684 language "eng".
- 98158684 publisher "Pennington, NJ : Electrochemical Society,".
- 98158684 subject "621.3815/2 21".
- 98158684 subject "Semiconductors Testing Congresses.".
- 98158684 subject "TK7871.85 .S954 1997".
- 98158684 title "Diagnostic techniques for semiconductor materials and devices".
- 98158684 title "Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices / editors, P. Rai-Choudhury ... [et al.].".
- 98158684 type "text".