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- 98193590 contributor B8498893.
- 98193590 contributor B8498894.
- 98193590 created "1998]".
- 98193590 date "1997".
- 98193590 date "1998]".
- 98193590 dateCopyrighted "1998]".
- 98193590 description "Includes bibliographical references.".
- 98193590 extent "v, 116 p. :".
- 98193590 identifier "0780343131 (microfiche ed.)".
- 98193590 identifier "0790800640 (softbound ed.)".
- 98193590 issued "1997".
- 98193590 issued "1998]".
- 98193590 language "eng".
- 98193590 publisher "[Arlington, VA : IEEE,".
- 98193590 subject "621.3815/2 21".
- 98193590 subject "Accelerated life testing Congresses.".
- 98193590 subject "Bipolar transistors Reliability Congresses.".
- 98193590 subject "Gallium arsenide semiconductors Reliability Congresses.".
- 98193590 subject "TK7871.15.G3 G32 1997".
- 98193590 title "Proceedings : 1997 GaAs Reliability Workshop : October 12, 1997, Anaheim, California / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc.".
- 98193590 type "text".