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- 98227309 contributor B8535313.
- 98227309 contributor B8535314.
- 98227309 created "c1998.".
- 98227309 date "1998".
- 98227309 date "c1998.".
- 98227309 dateCopyrighted "c1998.".
- 98227309 description "Includes bibliographical references and index.".
- 98227309 extent "v, 106 p. :".
- 98227309 identifier "0819427551".
- 98227309 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3315.".
- 98227309 isPartOf "SPIE proceedings series, 0277-786X ; v. 3315".
- 98227309 issued "1998".
- 98227309 issued "c1998.".
- 98227309 language "eng".
- 98227309 publisher "Bellingham, Wash., USA : The Society,".
- 98227309 subject "702/.8/74 21".
- 98227309 subject "Art Expertising Congresses.".
- 98227309 subject "Art Forgeries Congresses.".
- 98227309 subject "Art and science Congresses.".
- 98227309 subject "N8790 .S35 1998".
- 98227309 title "Scientific detection of fakery in art : 29-30 January 1998, San Jose, California / Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.".
- 98227309 type "text".