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- 99034071 contributor B8656835.
- 99034071 created "c2001.".
- 99034071 date "2001".
- 99034071 date "c2001.".
- 99034071 dateCopyrighted "c2001.".
- 99034071 description "Includes bibliographical references and index.".
- 99034071 extent "xii, 346 p. :".
- 99034071 identifier "1852331445 (alk. paper)".
- 99034071 identifier 99034071-d.html.
- 99034071 identifier 99034071-t.html.
- 99034071 issued "2001".
- 99034071 issued "c2001.".
- 99034071 language "eng".
- 99034071 publisher "London ; New York : Springer,".
- 99034071 subject "621.3815/2 21".
- 99034071 subject "Metal oxide semiconductors Defects.".
- 99034071 subject "Plasma radiaiton.".
- 99034071 subject "Semiconductors Effect of radiation on.".
- 99034071 subject "TK7871.85 .C4784 2001".
- 99034071 title "Plasma charging damage / Kin P. Cheung.".
- 99034071 type "text".