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- 99051735 contributor B8675870.
- 99051735 created "1999.".
- 99051735 date "1999".
- 99051735 date "1999.".
- 99051735 dateCopyrighted "1999.".
- 99051735 description "Includes bibliographical references and index.".
- 99051735 extent "xviii, 155 p. :".
- 99051735 identifier "0792386868".
- 99051735 identifier 99051735-b.html.
- 99051735 identifier 99051735-d.html.
- 99051735 identifier 99051735-t.html.
- 99051735 isPartOf "Frontiers in electronic testing".
- 99051735 issued "1999".
- 99051735 issued "1999.".
- 99051735 language "eng".
- 99051735 publisher "Boston : Kluwer Academic Publishers,".
- 99051735 subject "621.3815/48 21".
- 99051735 subject "Boundary scan testing.".
- 99051735 subject "Electronic digital computers Circuits Design and construction.".
- 99051735 subject "Mixed signal circuits Testing.".
- 99051735 subject "Printed circuits Testing Standards.".
- 99051735 subject "TK7868.P7 A53 1999".
- 99051735 title "Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard / edited by Adam Osseiran.".
- 99051735 type "text".