Matches in Library of Congress for { <http://lccn.loc.gov/99058100> ?p ?o. }
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- 99058100 contributor B8683073.
- 99058100 created "c2000.".
- 99058100 date "2000".
- 99058100 date "c2000.".
- 99058100 dateCopyrighted "c2000.".
- 99058100 description "Includes bibliographical references and index.".
- 99058100 extent "xv, 268 p. :".
- 99058100 identifier "3540642137 (hardcover : alk. paper)".
- 99058100 isPartOf "Springer series in materials science ; 24".
- 99058100 isPartOf "Springer series in materials science ; v. 24.".
- 99058100 issued "2000".
- 99058100 issued "c2000.".
- 99058100 language "eng".
- 99058100 publisher "Berlin ; New York : Springer,".
- 99058100 subject "621.3815/2 21".
- 99058100 subject "Contamination (Technology)".
- 99058100 subject "Semiconductors Defects.".
- 99058100 subject "Silicon Defects.".
- 99058100 subject "Silicon Inclusions.".
- 99058100 subject "TK7871.852 .G73 2000".
- 99058100 title "Metal impurities in silicon-device fabrication / Klaus Graff.".
- 99058100 type "text".