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- 99062857 contributor B8687432.
- 99062857 contributor B8687433.
- 99062857 created "c1999.".
- 99062857 date "1999".
- 99062857 date "c1999.".
- 99062857 dateCopyrighted "c1999.".
- 99062857 description "Includes bibliographical references.".
- 99062857 extent "viii, 188 p. :".
- 99062857 identifier "0780356497 (softbound)".
- 99062857 issued "1999".
- 99062857 issued "c1999.".
- 99062857 language "eng".
- 99062857 publisher "Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society,".
- 99062857 subject "621.3815 21".
- 99062857 subject "Integrated circuits Reliability Congresses.".
- 99062857 subject "Integrated circuits Wafer-scale integration Reliability Congresses.".
- 99062857 subject "TK7874 .I4735 1999".
- 99062857 title "1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.".
- 99062857 type "text".