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- 99067646 contributor B8691270.
- 99067646 contributor B8691271.
- 99067646 created "c2000.".
- 99067646 date "2000".
- 99067646 date "c2000.".
- 99067646 dateCopyrighted "c2000.".
- 99067646 description "Includes bibliographical references.".
- 99067646 extent "83 p. :".
- 99067646 identifier "0780358961 (softbound ed.)".
- 99067646 issued "2000".
- 99067646 issued "c2000.".
- 99067646 language "eng".
- 99067646 publisher "Piscataway, NJ : IEEE Electron Devices Society,".
- 99067646 subject "621.3815/2/0287 22".
- 99067646 subject "Semiconductors Characterization Statistical methods Congresses.".
- 99067646 subject "Semiconductors Measurement Congresses.".
- 99067646 subject "TK7871.85 .I5844 2000".
- 99067646 title "2000 5th International Workshop on Statistical Metrology : IWSM, June 11, 2000, Hawaii.".
- 99067646 type "text".