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- 99159849 contributor B8715268.
- 99159849 contributor B8715269.
- 99159849 created "c1998.".
- 99159849 date "1998".
- 99159849 date "c1998.".
- 99159849 dateCopyrighted "c1998.".
- 99159849 description "Includes bibliographical references and index.".
- 99159849 extent "xi, 386 p. :".
- 99159849 identifier "0819429821".
- 99159849 isPartOf "Proceedings of SPIE, 0277-786X ; v. 3521".
- 99159849 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3521.".
- 99159849 issued "1998".
- 99159849 issued "c1998.".
- 99159849 language "eng".
- 99159849 publisher "Bellingham, Wash. : SPIE,".
- 99159849 subject "670.42/5 21".
- 99159849 subject "Computer vision Congresses.".
- 99159849 subject "Computer vision Industrial applications Congresses.".
- 99159849 subject "Engineering inspection Automation Congresses.".
- 99159849 subject "Optical measurements Congresses.".
- 99159849 subject "TA1634 .M3355 1998".
- 99159849 title "Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts / Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers.".
- 99159849 type "text".