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- 99173757 contributor B8730739.
- 99173757 contributor B8730740.
- 99173757 created "1998.".
- 99173757 date "1998".
- 99173757 date "1998.".
- 99173757 dateCopyrighted "1998.".
- 99173757 description "Includes bibliographical references (p. 15).".
- 99173757 extent "16 p. ;".
- 99173757 isPartOf "Raporty IChJ. Seria B, 1425-7351 ; nr 10/98".
- 99173757 issued "1998".
- 99173757 issued "1998.".
- 99173757 language "Summary in English.".
- 99173757 language "pol eng".
- 99173757 language "pol".
- 99173757 publisher "Warszawa : Instytut Chemii i Techniki Jądrowej,".
- 99173757 subject "QC481.5 .A68 1998".
- 99173757 subject "X-rays Instruments Calibration.".
- 99173757 subject "X-rays Instruments Effect of radiation on.".
- 99173757 title "Badanie wpływu wygładzania widm na parametry modelu kalibracyjnego / Waldemar Antoniak, Piotr Urbański, Ewa Kowalska.".
- 99173757 type "text".