Matches in Library of Congress for { <http://lccn.loc.gov/99208103> ?p ?o. }
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- 99208103 alternative "1998 IEEE International Test Conference".
- 99208103 alternative "International Test Conference 1998".
- 99208103 contributor B8767921.
- 99208103 created "c1998.".
- 99208103 date "1998".
- 99208103 date "c1998.".
- 99208103 dateCopyrighted "c1998.".
- 99208103 description "Includes bibliographical references and index.".
- 99208103 extent "xvi, 1179 p. :".
- 99208103 identifier "0780350928 (softbound)".
- 99208103 identifier "0780350936 (casebound)".
- 99208103 identifier "0780350944 (microfiche)".
- 99208103 issued "1998".
- 99208103 issued "c1998.".
- 99208103 language "eng".
- 99208103 publisher "Washington, DC : International Test Conference,".
- 99208103 subject "621.3815/48 21".
- 99208103 subject "Embedded computer systems Testing Congresses.".
- 99208103 subject "Integrated circuits Testing Congresses.".
- 99208103 subject "Microprocessors Testing Congresses.".
- 99208103 subject "TK7874 .I5945 1998".
- 99208103 title "1998 IEEE International Test Conference".
- 99208103 title "International Test Conference 1998".
- 99208103 title "Proceedings, International Test Conference 1998.".
- 99208103 type "text".