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- 141699441 alternateName "Symposium M on Optical and X-Ray Metrology for Advanced Device Materials Characterization".
- 141699441 alternateName "Symposium on Optical and X-Ray Metrology for Advanced Device Materials Characterization 2003 Straßburg".
- 141699441 name "Symposium on Optical and X-Ray Metrology for Advanced Device Materials Characterization".
- 141699441 sameAs 5558470-6.
- 141699441 type Organization.
- 141699441 seeAlso skos:Concept.