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- Electromigration abstract "Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in electronics such as integrated circuits (ICs) decreases, the practical significance of this effect increases.".
- Electromigration thumbnail Electromigration.png?width=300.
- Electromigration wikiPageExternalLink statement.
- Electromigration wikiPageExternalLink wrapper.jsp?arnumber=4208466.
- Electromigration wikiPageExternalLink emig.htm.
- Electromigration wikiPageExternalLink index.php.
- Electromigration wikiPageExternalLink content.php?contid=2&artid=68.
- Electromigration wikiPageExternalLink Electromigration-for-Designers-An-Introduction-for-the-Non-Specialist.
- Electromigration wikiPageExternalLink ispd06_emPaper_lienig.pdf.
- Electromigration wikiPageID "563847".
- Electromigration wikiPageRevisionID "597005354".
- Electromigration hasPhotoCollection Electromigration.
- Electromigration subject Category:Electric_and_magnetic_fields_in_matter.
- Electromigration subject Category:Electronic_design_automation.
- Electromigration subject Category:Semiconductor_device_defects.
- Electromigration type Abstraction100002137.
- Electromigration type Attribute100024264.
- Electromigration type Defect114464005.
- Electromigration type Imperfection114462666.
- Electromigration type SemiconductorDeviceDefects.
- Electromigration type State100024720.
- Electromigration comment "Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in electronics such as integrated circuits (ICs) decreases, the practical significance of this effect increases.".
- Electromigration label "Electromigración".
- Electromigration label "Electromigration".
- Electromigration label "Elektromigration".
- Electromigration label "Elettromigrazione".
- Electromigration label "Électromigration".
- Electromigration label "Электромиграция".
- Electromigration label "エレクトロマイグレーション".
- Electromigration label "电迁移".
- Electromigration sameAs Elektromigration.
- Electromigration sameAs Electromigración.
- Electromigration sameAs Électromigration.
- Electromigration sameAs Elettromigrazione.
- Electromigration sameAs エレクトロマイグレーション.
- Electromigration sameAs 일렉트로마이그레이션.
- Electromigration sameAs m.02qfqz.
- Electromigration sameAs Q1319010.
- Electromigration sameAs Q1319010.
- Electromigration sameAs Electromigration.
- Electromigration wasDerivedFrom Electromigration?oldid=597005354.
- Electromigration depiction Electromigration.png.
- Electromigration isPrimaryTopicOf Electromigration.
