Matches in DBpedia 2014 for { ?s ?p <http://dbpedia.org/class/yago/SemiconductorDeviceDefects> . }
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- Catastrophic_optical_damage type SemiconductorDeviceDefects.
- Current_crowding type SemiconductorDeviceDefects.
- Electromigration type SemiconductorDeviceDefects.
- Failure_modes_of_electronics type SemiconductorDeviceDefects.
- Feedback_controlled_electromigration type SemiconductorDeviceDefects.
- Hot-carrier_injection type SemiconductorDeviceDefects.
- Negative_bias_temperature_instability type SemiconductorDeviceDefects.
- QBD_(electronics) type SemiconductorDeviceDefects.
- SILC_(semiconductors) type SemiconductorDeviceDefects.
- Thermal_runaway type SemiconductorDeviceDefects.
- Time-dependent_gate_oxide_breakdown type SemiconductorDeviceDefects.