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- Failure_modes_of_electronics abstract "Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits.Failures most commonly occur at near the beginning and near the ending of the lifetime of the parts, resulting in the bathtub curve graph of failure rates. Burn-in procedures are used to detect early failures. In semiconductor devices, parasitic structures, irrelevant for normal operation, become important in the context of failures; they can be both a source and protection against failure.Applications such as aerospace systems, life support systems, telecommunications, railway signals, and computers use great numbers of individual electronic components. Analysis of the statistical properties of failures can give guidance in designs to establish a given level of reliability. For example, power-handling ability of a resistor may be greatly derated when applied in high-altitude aircraft to obtain adequate service life; a part intended for a telephone switch that must run for decades has different reliability requirements than a part for a proximity fuze that must only operate for a few seconds.A sudden fail-open fault can cause multiple secondary failures if it is fast and the circuit contains an inductance; this causes large voltage spikes, which may exceed 500 volts. A broken metallisation on a chip may thus cause secondary overvoltage damage. Thermal runaway can cause sudden failures including melting, fire or explosions.".
- Failure_modes_of_electronics thumbnail Failed_SMPS_controller_IC_ISL6251.jpg?width=300.
- Failure_modes_of_electronics wikiPageID "26626178".
- Failure_modes_of_electronics wikiPageRevisionID "604295013".
- Failure_modes_of_electronics hasPhotoCollection Failure_modes_of_electronics.
- Failure_modes_of_electronics subject Category:Failure.
- Failure_modes_of_electronics subject Category:Fans.
- Failure_modes_of_electronics subject Category:Semiconductor_device_defects.
- Failure_modes_of_electronics type Abstraction100002137.
- Failure_modes_of_electronics type Attribute100024264.
- Failure_modes_of_electronics type Defect114464005.
- Failure_modes_of_electronics type Imperfection114462666.
- Failure_modes_of_electronics type SemiconductorDeviceDefects.
- Failure_modes_of_electronics type State100024720.
- Failure_modes_of_electronics comment "Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes.".
- Failure_modes_of_electronics label "Failure modes of electronics".
- Failure_modes_of_electronics sameAs m.0bh85rh.
- Failure_modes_of_electronics sameAs Q5429713.
- Failure_modes_of_electronics sameAs Q5429713.
- Failure_modes_of_electronics sameAs Failure_modes_of_electronics.
- Failure_modes_of_electronics wasDerivedFrom Failure_modes_of_electronics?oldid=604295013.
- Failure_modes_of_electronics depiction Failed_SMPS_controller_IC_ISL6251.jpg.
- Failure_modes_of_electronics isPrimaryTopicOf Failure_modes_of_electronics.
